FT-17R

Sovtest ATE, Ltd. presents its new development multifunctional relay tester FT-17R which is used for measurement parameters of direct and alternating current electromagnet relay for suitability to technical and GOST 16121-86 requirements. The relay tester is 19” stand with operator’s working place.

This equipment has got wide area of application. It can be used for control output products at electromagnet relay manufacturing facilities, for input control of relay parameters at consumer production and for control of relay parameters at certificate centers and “second supplier” as well. With the help of this development diagnosis of failure and relay parameters inspections can be held including influence of environment (vibration, shock, climate and other). Relay tester FT-17R is unique with its multifunctionality. Its abilities allow to achieve 6 controlled relay coil and 8 controlled relay contact groups with increasing possibility both of them. In basic configuration there is one working place but it is possible to enlarge number of simultaneous tested relays up to 4 pcs.

With the help of the relay tester FT-17R it is possible to carry out measurements of all the relay characteristics:

voltage and drop-off/pick-up current measurement,
contacts’ resistance and relay coil measurement (4 wire measurement),
isolation resistance measurement,
timing parameters measurement (pick-up time, drop-off time, overshoot time, time of transitional bounce process)
detection of three-point condition and false pick-up (during vibration resistance tests).

Due to latest technologies this tester shortens inspection time which now takes no more than 3 seconds per a relay with 2 contact sets. The equipment can operate in two modes: research mode (“expanded mode”) and presorting mode («valid or faulty»).

The multifunctional relay tester FT-17R provides simultaneous connection of maximum 6 terminal, closing or transfer contacts. It also provides time parameters control in single response and commutation modes.

Parameters under control:

pick-up time is a time interval from the moment of voltage supply on binding to the first contact closure (or contact breaking if relay has only terminal contacts);
drop-off time is a time interval from the moment of removal voltage from binding to the first contact closure (or contact breaking if relay has only terminal contacts);
bounce time at pick-up and drop-off is a time interval from the moment of the first contact closing to the beginning of the last closing, and from the moment of the first breaking to the last contact breaking;
overshoot time at pick-up and drop-off is a time interval from the moment of the first breaking of closing contact to the first closing of terminal contact;
time difference (for relays with more than 1set for switching) is a time interval from the moment of the first closing of any terminal contacts to breaking the last of the terminal contacts at pick-up and drop-off.

When measuring pick-up time, drop-off time, overshoot time and time difference there doesn’t count bounce time.

For relay inspection contact devices made for required types of body frame are used.

Along with the relay tester FT-17R the software is supplied to the customer for carrying out testing process and developing own testing programs for relay inspection by tester’s operator. Additionally there is provided software and equipment set for performing self-diagnostic and metrological calibration tests. Also there are statistics information processing and output.

The multifunctional relay tester FT-17R is included in State register of measuring equipment in Russian Federation, № 48854-12.

Related products

FT-17HF

The main purpose of the Complex is parametric, dynamic and functional control of digital and digital-to analog microchips at maximum frequency of 200 MHz. The complex consists of all-in-one boards which are made by means of “tester-on-channel” technology. Such architecture allows to get maximum measuring possibilities with minimum time control and expanses for gaging production.
In the Complex there can be up to 12 all-in-one boards with 768 outputs and specific boards for mixed-signal components control as well. As additional possibilities of system there can be implemented algorithms of memory structure testing.

Areas of application:

Output control of integrated microchips parameters (in body frame and on semiconductor board) in production and lab terms
Input control of integrated microchips parameters at consumer facilities
Scientific works, microelectronic products boundary parameters control
Learning process, study of principals of microelectronics and test equipment work

Features:

High productivity by means of modern architecture “tester-on channel” and wide range of parallel control possibilities
Multipurpose (both digital and digital-to-analog microchips control)
Flexibility (tester configuration can be easily changed and enlarged if necessary)
Tester measuring part is made in accordance with latest technologies in component basis sphere
Easy creation of testing sequences
Easy maintenance Possibility of direct coupling («hard» coupling) with automated loaders of products (probe stations, tunnel chambers and others)

Technical characteristics:

Number of measuring channels: 768 (up to 12 boards with 64 channels each)
Maximum frequency of test vectors sequence: 400 Mbps
Time parameters input increment: 39 picoseconds
Number of time marks per channel: 4 or 8 (in multiplexing mode)
Maximum channels error: ±250 picoseconds
Test vectors memory depth per channel: 128 Mbit (expansion to 256 Mbit)
Range of voltage assignment: - 2 ... +6 V (or 0… +8 V)
Maximum power: 4 kW
Cooling system: aerial
Compressed air/vacuum: is not required

FT-17DT

Testing system FT-17DT is a desktop type of FT-17HF tester (the previous Sovtest ATE specialists’ development in quality control of microelectronic products). The equipment construction has got ergonomical design which makes it the best solution for consumers who are concerned in certificated microchips tests and who use input control of components small sets at their facilities. As for technical abilities new model FT-17 HF is equal to the previous one, the only difference is in maximum number of pin-electronic modules (FT-17DT has got 4 modules and 256 measuring channels; FT-17HF has got 12 modules and 786 measuring channels). But the main advatntage of FT-17DT system is that this product is absolutely Russian development: from electronics to body frame.

The tester software XperTest is the result of Sovtest ATE specialists’ work as well and it supports Russian language.

Areas of application:

Output control of microelectronic components and systems parameters (in body frame and on semiconductor plate) in production and lab terms.
Input control of microelectronic components and systems parameters at ECB consumer facilities.
Scientific work, control of microelectronic components boundary parameters and systems, certificated tests.

Objects under control and measure:

Digital IS of random logic (PLD, microprocessors, microcontrollers, IS of standard logic, etc.)
Memory devices (RAM, RAM of different types)
Digital-to-analog IS (AD converters, DA converters, on-chip systems)
RFID (RF tags, smart cards)

FT-17

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FT-17R

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Relay tester FT-17R