- Test equipment for microelectronics and components
- PCB testers
- Analysers of manufacturing defects (MDA)
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The main purpose of the Complex is parametric, dynamic and functional control of digital and digital-to...
The main purpose of the Complex is parametric, dynamic and functional control of digital and digital-to analog microchips at maximum frequency of 200 MHz. The complex consists of all-in-one boards which are made by means of “tester-on-channel” technology....
Testing system FT-17DT is a desktop type of FT-17HF tester (the previous Sovtest ATE specialists’ ...
Testing system FT-17DT is a desktop type of FT-17HF tester (the previous Sovtest ATE specialists’ development in quality control of microelectronic products). The equipment construction has got ergonomical design which makes it the best solution for...
Sovtest ATE, Ltd. presents its new development multifunctional relay tester FT-17R which is used for...
Sovtest ATE, Ltd. presents its new development multifunctional relay tester FT-17R which is used for measurement parameters of direct and alternating current electromagnet relay for suitability to technical and GOST 16121-86 requirements. The relay tester...
Complex Functional Control Test Bench for Electronic Blocks and Components Model FT-17
FT-17 is a flexible multi-purpose automated test system for functional and parametric control of digital and analog electronic units. The functioning of FT-17 is based on the method of controlling impact generation on the tested unit with further handling...