Testing & Diagnostics

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The main purpose of the Complex is parametric, dynamic and functional control of digital and digital-to...
The main purpose of the Complex is parametric, dynamic and functional control of digital and digital-to analog microchips at maximum frequency of 200 MHz. The complex consists of all-in-one boards which are made by means of “tester-on-channel” technology....
The tester control PCB with quick change adapter S90
The tester is designed to check for breaks and short - bilateral and multi-layer printed circuit boards with a minimum pitch between the test pads 1 mm. Tester is an inexpensive test system for large-scale and mass production of PP / WFP.
The tester ...
Testing system FT-17DT is a desktop type of FT-17HF tester (the previous Sovtest ATE specialists’ ...
Testing system FT-17DT is a desktop type of FT-17HF tester (the previous Sovtest ATE specialists’ development in quality control of microelectronic products). The equipment construction has got ergonomical design which makes it the best solution for...
Sovtest ATE burn-in complexes are made for widespread use in terms of both series production at the ...
Sovtest ATE burn-in complexes are made for widespread use in terms of both series production at the stage of product manufacturing and during input control at companies who use microelectronics devices and at companies who perform certificated...
Sovtest ATE, Ltd. presents its new development multifunctional relay tester FT-17R which is used for...
Sovtest ATE, Ltd. presents its new development multifunctional relay tester FT-17R which is used for measurement parameters of direct and alternating current electromagnet relay for suitability to technical and GOST 16121-86 requirements. The relay tester...
Sovtest Fault Locator SFL3500
Import replacement
Test Technology: Analog signature analysis
Test Ranges:0..10 V / 200 mA — 167 µA: step 0,05 V; 0..40 V / 800 mA — 667 µA: step 0,2 V
Frequency Range:5 Hz…4 KHz has 800 steps divisible of 2 (4 KHz, 2 KHz, 1 KHz, 1333,3 Hz, 1000 Hz, 800...
Wire harness and PCB tester STC-1000
DESTINATION
  • Electrical parameters and cable geometry testing.• Localization of the wiring defects of aviation, marine and railway equipment.
  • Testing of the medical equipment wires and data cables.
  • Testing of the interface and electric...
Wire harness tester WeeTech W434 is developed for detection and localization of wire harness, binders...
Wire harness tester WeeTech W434 is developed for detection and localization of wire harness, binders and cables defects and for components’ functional control. High-speed measure instrument allows automatic inspection of tested products for suitability...
Complex Functional Control Test Bench for Electronic Blocks and Components Model FT-17
FT-17 is a flexible multi-purpose automated test system for functional and parametric control of digital and analog electronic units. The functioning of FT-17 is based on the method of controlling impact generation on the tested unit with further handling...
Relay module is made for program commutation of input and output signals with the help of relay  and...
Relay module is made for program commutation of input and output signals with the help of relay  and it structural takes one  location in instrument chassis SFX.

The module is built on relay which manages test controller commands.

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The module is made to generate orthogonal pulses with frequency between 1 and 75 000 Hz and to set up...
The module is made to generate orthogonal pulses with frequency between 1 and 75 000 Hz and to set up charges which help to imitate resistible charges within 0.5 and 120 kOhm. The module is for imitating automobile sensors signals (frequented and resistible)...
SDIO modules are developed for functional control of digital devices at maximum frequency 50 MHz and...
SDIO modules are developed for functional control of digital devices at maximum frequency 50 MHz and they are used FT-17 and FTT-17complexes.

SDIO modules allows to perform digital tests at frequency between 5 Hz and 50 MHz when driver input signal...
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